TEM techniques progress and samples can be observed atomic level. Selected area electron diffraction (SAD) which is one of the transmission electron microscopy techniques is difficult to apply to nano sized area. 2 dimensional fast Fourier transform (2D-FFT) was used for structural analysis of small area of carbon materials. The 2D-FFT gives comparable result with SAD and useful for nano sized carbon materials. In this study, we try to prove that the 2D-FFT gives comparable result with SAD and useful for nano structured carbons.