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品質工学を用いた増幅回路の安定化設計法
https://nagano-nct.repo.nii.ac.jp/records/205
https://nagano-nct.repo.nii.ac.jp/records/205e76c50fb-7064-44b9-a7bf-09a191c64c61
名前 / ファイル | ライセンス | アクション |
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nagano_nct-36-05.pdf (247.2 kB)
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Item type | Departmental Bulletin Paper(1) | |||||
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公開日 | 2013-02-19 | |||||
タイトル | ||||||
タイトル | 品質工学を用いた増幅回路の安定化設計法 | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 増幅器 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 温度試験 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | パラメータ設計 | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | 割付表 | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
その他(別言語等)のタイトル | ||||||
その他のタイトル | Robust Design of Transistor Amplifier Applying Taguchi Method | |||||
著者 |
青木, 博夫
× 青木, 博夫 |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Today, development of electric apparatus using simulators is widely spread. However, it is doubtful whether high reliability design is carried out only by the simulation methods. Quality engineering is the knowledge/methodology known as Taguchi methods applied to various fields. So this paper describes that combination the simulation and the Taguchi methods is useful to robust design of electric circuit. From the result it was clarified that the factors of ratio of bias resistors is most affect SN ratio. In regard to the sensitivity, collector current and load resistance are significantly affect. | |||||
書誌情報 |
長野工業高等専門学校紀要 巻 36, p. 19-22, 発行日 2002-06-28 |
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出版者 | ||||||
出版者 | 長野工業高等専門学校 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0286-1909 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00179170 | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |