@article{oai:nagano-nct.repo.nii.ac.jp:00000268,
 author = {OSHIDA, Kyoichi and NAKAZAWA, Tatsuo},
 journal = {長野工業高等専門学校紀要},
 month = {Dec},
 note = {application, The practical image analysis method for the microscope pictures of electrical materials is introduced. The frequency analysis of the digitized TEM pictures by using a 2-dimensional (2D) fast Fourier transform (FFT) and the real space images reconstruction by means of the 2D inverse FFT (IFFT) are mentioned. The concrete picture image reconstruction method by 2D-IFFT is illustrated.},
 pages = {41--47},
 title = {Space frequency analysis of microscope images by 2-dimensional fast Fourier transform},
 volume = {34},
 year = {2000}
}