{"created":"2023-06-20T15:40:10.932592+00:00","id":268,"links":{},"metadata":{"_buckets":{"deposit":"30b0fbcf-e82b-4690-af79-a0d23376602a"},"_deposit":{"created_by":17,"id":"268","owners":[17],"pid":{"revision_id":0,"type":"depid","value":"268"},"status":"published"},"_oai":{"id":"oai:nagano-nct.repo.nii.ac.jp:00000268","sets":["3:16"]},"author_link":["542","543"],"item_2_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-12-27","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"47","bibliographicPageStart":"41","bibliographicVolumeNumber":"34","bibliographic_titles":[{"bibliographic_title":"長野工業高等専門学校紀要"}]}]},"item_2_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application","subitem_description_type":"Other"}]},"item_2_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The practical image analysis method for the microscope pictures of electrical materials is introduced. The frequency analysis of the digitized TEM pictures by using a 2-dimensional (2D) fast Fourier transform (FFT) and the real space images reconstruction by means of the 2D inverse FFT (IFFT) are mentioned. The concrete picture image reconstruction method by 2D-IFFT is illustrated.","subitem_description_type":"Abstract"}]},"item_2_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"長野工業高等専門学校"}]},"item_2_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00179170","subitem_source_identifier_type":"NCID"}]},"item_2_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0286-1909","subitem_source_identifier_type":"ISSN"}]},"item_2_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"OSHIDA, Kyoichi"}],"nameIdentifiers":[{"nameIdentifier":"542","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"NAKAZAWA, Tatsuo"}],"nameIdentifiers":[{"nameIdentifier":"543","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-02-19"}],"displaytype":"detail","filename":"nagano_nct-34-07.pdf","filesize":[{"value":"1.4 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"nagano_nct-34-07.pdf","url":"https://nagano-nct.repo.nii.ac.jp/record/268/files/nagano_nct-34-07.pdf"},"version_id":"b2b3d845-b67a-4cd2-942f-a73038fba43e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Transmission electron microscopy","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Image analysis","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Fast Fourier transform","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Graphite intercalation compounds","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Space frequency analysis of microscope images by 2-dimensional fast Fourier transform","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Space frequency analysis of microscope images by 2-dimensional fast Fourier transform","subitem_title_language":"en"}]},"item_type_id":"2","owner":"17","path":["16"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-02-19"},"publish_date":"2013-02-19","publish_status":"0","recid":"268","relation_version_is_last":true,"title":["Space frequency analysis of microscope images by 2-dimensional fast Fourier transform"],"weko_creator_id":"17","weko_shared_id":-1},"updated":"2023-06-20T16:13:03.168768+00:00"}