Transmission electron microscopy, Image analysis, Fast Fourier transform, Graphite intercalation compounds
抄録
The practical image analysis method for the microscope pictures of electrical materials is introduced. The frequency analysis of the digitized TEM pictures by using a 2-dimensional (2D) fast Fourier transform (FFT) and the real space images reconstruction by means of the 2D inverse FFT (IFFT) are mentioned. The concrete picture image reconstruction method by 2D-IFFT is illustrated.
Space frequency analysis of microscope images by 2-dimensional fast Fourier transform
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nagano_nct-34-07.pdf
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